Scanning Probe

The scanning probe facilities available at our four university partners cover a wide range of techniques, including atomic force microscopy (AFM), atomic force microscope infrared-spectroscopy (AFM-IR), electron microprobes (EMP), electron probe microanalysers (EMPA), auger electron spectroscopy (AES) instruments and atom probe tomography.
Details of each technique can be found below:

For more information, email: